Chair: Andy Behr, Panasonic Co-Chair: Michael Jansen, Raytheon Company
>>X-ray Micro-Computed Tomography Based FE Models to Capture Realistic Manufacturing Variability in Cu-Al Wirebonds and Solder-Joints in QFNs *Pradeep Lall, Ph.D., Madhu Kasturi, Nakul Kothari, Auburn University; David Locker, US Army CCDC Aviation & Missile Center
>>Real Time X-Ray Analysis of Void Formation and Dynamics in QFN Devices During Reflow Evstatin Krastev, Sandeep Kullar, Christopher Rand, Nordson Dage
>>Identifying Voids on BTC Assemblies with X-ray Analysis *Bill Cardoso, Ph.D., Creative Electron, Inc.
>>New X-Ray Technologies for Enhanced Void Investigation *Ragnar Vaga, YXLON International GmbH
Wednesday September 25, 2019 8:00am - 10:00am CDT
Room 48