SMTA International 2019

Chair: *Rob Bougski, Datest Corporation
Co-Chair: *Glen Thomas, Ph.D., Creative Electron, Inc.

>>Micro-Computed Tomography Analysis for Failure Analysis in Electronics
Claire Brennan, Ph.D., Collins Aerospace

>>Improve AOI Performance through Smart Visual Insight Solutions Collaboration
Wayne Zhang, Ph.D., , Ziv Zhao, Ben Wu, Peng Tang,Yan Wang, Marie Cole, Li Qin Shen, Andrew Vogel,
IBM China Procurement Company

>>An Interesting Approach to Yield Improvement
*Keith Bryant, Keith Bryant Consultancy