>>Vacuum Reflow Processing of Ball Grid Array Packages for Reduced Solder Joint Voiding and Improved Attachment Reliability *Richard Coyle, Ph.D., Charmaine Johnson, Richard Popowich, Nokia Bell Labs; Tim Pearson, Dave Hillman, Collins Aerospace; Michael Meilunas, Universal Instruments; Fred Dimock, Bob Bouchard, BTU International; Richard Parker, iNEMI; Keith Howell, Nihon Superior Co., Ltd.; *Jörg Trodler, Dipl. -Ing,. Heraeus Electronics; Arvind Karthikeyan, Auburn University; Elizabeth Barr, Iowa State University
>>Effect of Vacuum Reflow on Solder Joint Voiding in Bumped Components Arvind Srinivasan Karthikeyan, *Sa’d Hamasha, Ph.D., Auburn University; Michael Meilunas, Universal Instruments Corporation; Fred Dimock, BTU International, Inc.
Tuesday September 24, 2019 2:00pm - 3:30pm CDT
Room 44