Chair: *Andre Delhaise, Celestica Co-Chair: *Lars Bruno M.Sc., Ericsson AB
>>Thermal Cycling Reliability and Failure Mode of Two Ball Grid Array Packages with High Reliability Pb-Free Solder Alloys *Richard Coyle, Ph.D., Nokia Bell Labs
>>Attachment Quality and Thermal Fatigue Reliability of a Surface Mount Chip Resistor Assembled with a Low Temperature Solder Charmaine Johnson, *Richard Coyle, Ph.D., Richard Popowich, Chen Xu, Nokia Bell Labs; *Martin Anselm, Ph.D., Ajitesh Singh Parihar, Tayler Swanson, Rochester Institute of Technology; *Lenora Clark, *Jason Fullerton, MacDermid Alpha Electronic Solutions
>>Bottom Terminated Component (BTC) Void Concerns: Real and Imagine *David Hillman, Ross Wilcoxon, Tim Pearson, Kim Cho, Collins Aerospace
>>Status of Pb-free Risk Mitigation for Aerospace and Defense – “An Attitude Adjustment” Perspective *Anthony Rafanelli, Ph.D., P.E., Raytheon Company
Thursday September 26, 2019 8:00am - 9:00am CDT
Room 49